KEYSIGHT Technologies

The Atomic Force Microscopy Resource Library

Electronic Materials

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Intrinsic Contact Noise A Figure of merit for identifying

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Scanning Microwave Microscopy Application note

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Introduction to Scanning Microwave Microscopy Application note

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Advanced Atomic Force Microscope: Exploring Measurement of Local Electrical Properties.

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SMM for Semiconductor Failure Analysis

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Applications of KFM, CSAFM and Environmental Control in Fuel Cell Research

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Photovoltaic Application

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5990-5025EN Applications of KFM and CSAFM_STM in Characterization of Photovoltaic materials

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Attofarad Capacitance Measurement with SMM

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PFM Experiments with High Voltage DC/AC Bias

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Investigating Highly Dopant Marker Layers in GaN on Sapphire Using SMM

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Quantitative Surface Potential Measurement Using KFM

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SMM Imaging of Dopant Structures of Semiconductor Devices

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Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

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SMM Empro - Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM experiments

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Electrical Measurement - Utilization of Keysight Nanoelectrix AFM Systems for Nanoscale Electrical Investigation

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Surface Potential Measurements Using the Agilent 7500 AFM

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7500 Current Seensing App brief - Current Sensing AFM Measurements Using Agilent 7500 AFM

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Single Pass KFM Graphene - Single Pass KFM Study of Current Transport in Graphene and Graphene to Metal Contacts

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