KEYSIGHT Technologies

The Atomic Force Microscopy Resource Library

Materials Science

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Carbon Nanotube Tips for MAC Mode® AFM Measurements in Liquids

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MacMode AFM for Precision Interfacial Force Measurements

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Using Non-Contact AFM to Image Liquid Topographies

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Studies of Polyvinyl Alcohol

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Manipulation of Gold Particles

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Adsorption of Poly(2-vinylpyridine) Wormlike Polyelectrolyte Brushes

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Probing Polymer Surface Properties with Multiple Imaging

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Intrinsic Contact Noise A Figure of merit for identifying

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Probing the Three-Dimensional Structure of Surfactant

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Piezoresponse Force Microscopy

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New Approach to Generate Thiol-terminated SAMS on Gold

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New Approach to Generate Thiol-terminated SAMS on Gold

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Application of AFM on Particle Characterization

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Force Spectroscopy with AFM

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Using Thermal K to Calibrate the Spring Constants (k) of AFM Probes

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5600LS High Resolution Imaging Molecular level Understanding of n-Alkanes

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High-Resolution Tip Positioning Facilitates In Situ AFM Studies

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Photovoltaic Application

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Pros and Cons of AFM & NI:Stretching the Funcationality

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Several Aspects of Hi-Resolution Imaging

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PFM Experiments with High Voltage DC/AC Bias

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Atomic Force Microscopy Studies in Various Environments

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Microscopic Characterization of Few-layer Hexagonal Boron Nitride: A promising Analogue Graphene

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Thickness-dependent Electrical Propertiesof Single-layer Graphene and Few-layer Graphene: a Kelvin Force

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Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

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Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

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Using Nanomeasurement Systems for Nanoscale Investigations of Graphene

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Magnetic Force Microscopy Studies Using the Agilent 7500 AFM

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Humidity-dependent Surface Chemistry Studied by Agilent 7500 Atomic Force Microscopy

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Agilent 7500 AFM Applications in Polymer Materials

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Vapor Annealing Effect on Copolymers Studied by Agilent 7500 Atomic Force Microscopy with Environmental

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Elastic Modulus Mapping Using the Agilent 7500 AFM

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Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM

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Humidity-dependent AFM Nanolithography

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High Resolution Imaging with Agilent 7500 AFM

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Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy

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Nanotribological Studies of Lubricating Thin Films by Friction Force Microscopy

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High Resolution Scanning Probe Microscopy in Controlled Environment

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