KEYSIGHT Technologies

The Atomic Force Microscopy Resource Library

Materials Science

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9500 AFM Applications in Polymer Materials

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A New Approach to Generate Thiol-terminated SAMS on Gold

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AFM Study of Structural Organization of Liquid Crystalline Oligomer

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Adopting Fast Imaging in Atomic Force Microscopy

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Adsorption of Poly(2-vinylpyridine) Wormlike Polyelectrolyte Brushes on Mica Studied in situ with MAC Mode® AFM

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Atomic Force Microscopy Studies of Materials in Different Vapor Environments

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Atomic Force Microscopy of Heterogeneous Materials in Different Environments

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Atomic Force Microscopy Studies in Various Environments

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Carbon Nanotube Tips for MAC Mode® AFM Measurements in Liquids

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Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope

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Force Spectroscopy with AFM

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High Resolution Imaging with Keysight 7500 AFM

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High Resolution Imaging with Keysight 9500 AFM

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High Resolution Imaging Molecular level Understanding of n-Alkanes Self-Assembly onto Graphite

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High Resolution Scanning Probe Microscopy in Controlled Environment

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Humidity-dependent Surface Chemistry Studied by Keysight 7500 Atomic Force Microscopy

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Imaging with Self-Sensing Cantilever on Keysight 5500/5600LS Atomic Force Microscopes

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Intrinsic Contact Noise A Figure of merit for identifying High Resolution AFMs

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KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry

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MAC Mode® AFM for Precision Interfacial Force Measurements

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Magnetic Force Microscopy Using the 9500 AFM

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Magnetic Force Microscopy Studies Using the Keysight 7500 AFM

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Manipulation of Gold Particles in Liquids Using MAC Mode® Atomic Force Microscopy

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Nanomechanical Studies in Atomic Force Microscopy

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Nanotribological Studies of Lubricating Thin Films by Friction Force Microscopy

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Piezoresponse Force Microscopy

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Piezoresponse Force Microscopy using Keysight 9500 AFM

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Probing Polymer Surface Properties with Multiple Imaging Modes

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Probing the Three-Dimensional Structure of Soft Organized Surfactants at the Solid-Liquid Interface via Atomic Force Microscopy

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QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM

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Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization

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Several Aspects of Hi-Resolution Imaging in Atomic Force Microscopy

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Studies of Polyvinyl Alcohol under Temperature and Humidity Control

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Studying Thermal Transitions of Materials Using Quick Scan Technology in Atomic Force Microscopy

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Thickness-dependent Electrical Propertiesof Single-layer Graphene and Few-layer Graphene: a Kelvin Force Microscopy Study

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Using Atomic Force Microscopy and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials

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Using Non-Contact AFM to Image Liquid Topographies

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Vapor Annealing Effect on Copolymers Studied by Keysight 7500 Atomic Force Microscopy with Environmental Control

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Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity

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